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Kang, Ji-Hoon http://orcid.org/0000-0001-6805-9840

Shin, Heechang http://orcid.org/0009-0007-3490-244X

Kim, Ki Seok http://orcid.org/0000-0002-7958-4058

Song, Min-Kyu http://orcid.org/0000-0002-9233-9356

Lee, Doyoon http://orcid.org/0000-0003-4355-8146

Meng, Yuan http://orcid.org/0000-0002-5409-5610

Choi, Chanyeol http://orcid.org/0000-0003-3304-3253

Suh, Jun Min http://orcid.org/0000-0001-8506-0739

Kim, Beom Jin http://orcid.org/0009-0001-7838-6420

Kim, Hyunseok

Hoang, Anh Tuan http://orcid.org/0000-0003-0911-1391

Park, Bo-In http://orcid.org/0000-0002-9084-3516

Zhou, Guanyu

Sundaram, Suresh http://orcid.org/0000-0003-3194-2730

Vuong, Phuong http://orcid.org/0000-0003-2775-7081

Shin, Jiho http://orcid.org/0009-0008-4971-5353

Choe, Jinyeong

Xu, Zhihao

Younas, Rehan http://orcid.org/0000-0001-8091-0562

Kim, Justin S.

Han, Sangmoon

Lee, Sangho http://orcid.org/0000-0003-4164-1827

Kim, Sun Ok

Kang, Beomseok http://orcid.org/0000-0003-3562-6233

Seo, Seungju http://orcid.org/0000-0002-1676-7172

Ahn, Hyojung

Seo, Seunghwan http://orcid.org/0000-0002-1703-2709

Reidy, Kate http://orcid.org/0000-0003-1178-0009

Park, Eugene http://orcid.org/0000-0001-6573-9162

Mun, Sungchul

Park, Min-Chul http://orcid.org/0000-0002-8575-085X

Lee, Suyoun http://orcid.org/0000-0002-5147-6821

Kim, Hyung-Jun

Kum, Hyun S. http://orcid.org/0000-0002-8009-569X

Lin, Peng http://orcid.org/0000-0002-0679-8063

Hinkle, Christopher http://orcid.org/0000-0002-5485-6600

Ougazzaden, Abdallah http://orcid.org/0000-0002-9959-5280

Ahn, Jong-Hyun http://orcid.org/0000-0002-8135-7719

Kim, Jeehwan http://orcid.org/0000-0002-1547-0967

Bae, Sang-Hoon http://orcid.org/0000-0002-1518-7635

Funding for this research was provided by:

Korea Institute of Science and Technology (2E32260)

National Research Foundation of Korea (NRF-2021R1A6A3A14044297)

National Science Foundation (DMR-1921818)

Semiconductor Research Corporation

National Research Foundation of Korea (NRF-2015R1A3A2066337)

Washington University in St. Louis

Text and Data Mining valid from 2023-11-27

Version of Record valid from 2023-11-27