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Projected performance of Si- and 2D-material-based SRAM circuits ranging from 16 nm to 1 nm technology nodes

Crossref DOI link: https://doi.org/10.1038/s41565-024-01693-3

Published Online: 2024-06-21

Published Print: 2024-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Lu, Yu-Cheng https://orcid.org/0009-0005-5273-9450
Huang, Jing-Kai https://orcid.org/0000-0002-7187-2653
Chao, Kai-Yuan

Li, Lain-Jong https://orcid.org/0000-0002-4059-7783
Hu, Vita Pi-Ho https://orcid.org/0000-0002-6216-214X
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Text and Data Mining valid from 2024-06-21

Version of Record valid from 2024-06-21
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Article History

Received: 19 June 2023

Accepted: 8 May 2024

First Online: 21 June 2024

Competing interests

: The authors declare no competing interests.