Accurate characterization of next-generation thin-film photodetectors
Crossref DOI link: https://doi.org/10.1038/s41566-018-0288-z
Published Online: 2018-12-14
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fang, Yanjun
Armin, Ardalan
Meredith, Paul
Huang, Jinsong
Text and Data Mining valid from 2018-12-14
Article History
First Online: 14 December 2018