Progenitor exhausted T cells contribute to the formation of immunological memory
Crossref DOI link: https://doi.org/10.1038/s41577-025-01182-1
Published Online: 2025-05-06
Published Print: 2025-06
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Wu, Annette
Jiang, Wen https://orcid.org/0000-0001-9154-633X
Text and Data Mining valid from 2025-05-06
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Article History
First Online: 6 May 2025