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High-throughput characterization is key to report reliable organic thin-film transistor performance

Crossref DOI link: https://doi.org/10.1038/s41578-024-00689-8

Published Online: 2024-05-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Manion, Joseph http://orcid.org/0000-0002-9962-140X
Lessard, Benoît H. http://orcid.org/0000-0002-9863-7039
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Text and Data Mining valid from 2024-05-08

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Article History

First Online: 8 May 2024

Competing interests

: The authors declare no competing interests.