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Author Correction: Dielectric breakdown of oxide films in electronic devices

Crossref DOI link: https://doi.org/10.1038/s41578-024-00752-4

Published Online: 2024-10-30

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Padovani, Andrea https://orcid.org/0000-0003-1145-5257
La Torraca, Paolo https://orcid.org/0000-0003-4852-4623
Strand, Jack

Larcher, Luca

Shluger, Alexander L.
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Article History

First Online: 30 October 2024

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