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Fast universal quantum gate above the fault-tolerance threshold in silicon

Crossref DOI link: https://doi.org/10.1038/s41586-021-04182-y

Published Online: 2022-01-19

Published Print: 2022-01-20

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Noiri, Akito http://orcid.org/0000-0001-9145-0303
Takeda, Kenta http://orcid.org/0000-0003-1240-1103
Nakajima, Takashi http://orcid.org/0000-0001-6759-6441
Kobayashi, Takashi http://orcid.org/0000-0003-2841-8129
Sammak, Amir

Scappucci, Giordano http://orcid.org/0000-0003-2512-0079
Tarucha, Seigo http://orcid.org/0000-0001-7465-0135
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Text and Data Mining valid from 2022-01-19

Version of Record valid from 2022-01-19
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Article History

Received: 4 August 2021

Accepted: 26 October 2021

First Online: 19 January 2022

Competing interests

: The authors declare no competing interests.