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Mapping internal temperatures during high-rate battery applications

Crossref DOI link: https://doi.org/10.1038/s41586-023-05913-z

Published Online: 2023-05-17

Published Print: 2023-05-18

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Heenan, T. M. M.

Mombrini, I. https://orcid.org/0000-0002-3969-6426
Llewellyn, A.

Checchia, S. https://orcid.org/0000-0003-0499-4885
Tan, C.

Johnson, M. J.

Jnawali, A.

Garbarino, G. https://orcid.org/0000-0003-4780-9520
Jervis, R. https://orcid.org/0000-0003-2784-7802
Brett, D. J. L. https://orcid.org/0000-0002-8545-3126
Di Michiel, M.

Shearing, P. R. https://orcid.org/0000-0002-1387-9531
License Information

Text and Data Mining valid from 2023-05-17

Version of Record valid from 2023-05-17
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Article History

Received: 1 July 2022

Accepted: 2 March 2023

First Online: 17 May 2023

Competing interests

: The authors declare no competing interests.