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X-ray induced electrostatic graphene doping via defect charging in gate dielectric

Published Online: 2017-04-03

Authors

Procházka, Pavel

Mareček, David

Lišková, Zuzana

Čechal, Jan

Šikola, Tomáš
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Text and Data Mining valid from 2017-04-03

Version of Record valid from 2017-04-03
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Article History

Received: 15 December 2016

Accepted: 8 March 2017

First Online: 3 April 2017

Competing Interests

: The authors declare that they have no competing interests.

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