On the influence of interface charging dynamics and stressing conditions in strained silicon devices
Crossref DOI link: https://doi.org/10.1038/s41598-017-05067-9
Published Online: 2017-08-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Olivares, Irene
Angelova, Todora
Sanchis, Pablo http://orcid.org/0000-0003-2984-4218
Text and Data Mining valid from 2017-08-03
Version of Record valid from 2017-08-03
Article History
Received: 23 February 2017
Accepted: 23 May 2017
First Online: 3 August 2017
Competing Interests
: The authors declare that they have no competing interests.