Simultaneous measurements of top surface and its underlying film surfaces in multilayer film structure
Crossref DOI link: https://doi.org/10.1038/s41598-017-11825-6
Published Online: 2017-09-19
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ghim, Young-Sik
Rhee, Hyug-Gyo
Davies, Angela
Text and Data Mining valid from 2017-09-19
Version of Record valid from 2017-09-19
Article History
Received: 8 June 2017
Accepted: 30 August 2017
First Online: 19 September 2017
Competing Interests
: The authors declare that they have no competing interests.