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Memory characteristics of silicon nanowire transistors generated by weak impact ionization

Published Online: 2017-09-29

Authors

Lim, Doohyeok

Kim, Minsuk

Kim, Yoonjoong

Kim, Sangsig
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Text and Data Mining valid from 2017-09-29

Version of Record valid from 2017-09-29
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Article History

Received: 2 March 2017

Accepted: 5 September 2017

First Online: 29 September 2017

Competing Interests

: The authors declare that they have no competing interests.

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