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Spatially Resolved Thermometry of Resistive Memory Devices

Crossref DOI link: https://doi.org/10.1038/s41598-017-14498-3

Published Online: 2017-11-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Yalon, Eilam https://orcid.org/0000-0001-7965-459X
Deshmukh, Sanchit

Muñoz Rojo, Miguel https://orcid.org/0000-0001-9237-4584
Lian, Feifei

Neumann, Christopher M. https://orcid.org/0000-0002-4705-9478
Xiong, Feng https://orcid.org/0000-0001-8383-5182
Pop, Eric https://orcid.org/0000-0003-0436-8534
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Text and Data Mining valid from 2017-11-10

Version of Record valid from 2017-11-10
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Article History

Received: 6 June 2017

Accepted: 11 October 2017

First Online: 10 November 2017

Competing Interests

: The authors declare that they have no competing interests.