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Hydrogen and the Light-Induced Bias Instability Mechanism in Amorphous Oxide Semiconductors

Crossref DOI link: https://doi.org/10.1038/s41598-017-17290-5

Published Online: 2017-12-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Li, Hongfei https://orcid.org/0000-0002-8456-5361
Guo, Yuzheng

Robertson, John
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Text and Data Mining valid from 2017-12-04

Version of Record valid from 2017-12-04
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Article History

Received: 13 September 2017

Accepted: 22 November 2017

First Online: 4 December 2017

Competing Interests

: The authors declare that they have no competing interests.