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Authors
Otto, Lauren M.
Ogletree, D. Frank
Aloni, Shaul
Staffaroni, Matteo
Stipe, Barry C.
Hammack, Aeron T.
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Article History
Received: 14 February 2018
Accepted: 23 March 2018
First Online: 10 April 2018
Competing Interests
: Although some of the authors of this paper, Lauren M Otto, Matteo Staffaroni, Barry C. Stipe, and Aeron T. Hammack, were recently or are currently employed by companies that develop HAMR devices, Western Digital and TDK Headway, this work covers device characterization techniques at a very basic scientific level that would be unlikely to significantly impact the valuation of these companies. Additionally, the publication of this manuscript was evaluated and approved by Western Digital, but this evaluation and approval was undertaken in order to ensure that trade secrets for proprietary internal design and manufacturing protocols were not revealed.
