Optical nonlinearities in ultra-silicon-rich nitride characterized using z-scan measurements
Crossref DOI link: https://doi.org/10.1038/s41598-019-46865-7
Published Online: 2019-07-17
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sohn, Byoung-Uk
Choi, Ju Won
Ng, Doris K. T.
Tan, Dawn T. H.
Text and Data Mining valid from 2019-07-17
Version of Record valid from 2019-07-17
Article History
Received: 11 March 2019
Accepted: 5 July 2019
First Online: 17 July 2019
Competing Interests
: The authors declare no competing interests.