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Non-contact characterization of compound optical elements using reflectance confocal microscopy, low-coherence interferometry, and computational ray-tracing

Crossref DOI link: https://doi.org/10.1038/s41598-019-53369-x

Published Online: 2019-11-19

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

El-Haddad, Mohamed T.

Tao, Yuankai K.
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Text and Data Mining valid from 2019-11-19

Version of Record valid from 2019-11-19
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Article History

Received: 23 June 2019

Accepted: 31 October 2019

First Online: 19 November 2019

Competing interests

: M.T.H. and Y.K.T. are listed as co-inventors on invention disclosures and patent applications filed through Vanderbilt University on the system and methods described in this manuscript.

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