A New Fitting Method for Ambipolar Diffusion Length Extraction in Thin Film Structures Using Photoluminescence Measurement with Scanning Excitation
Crossref DOI link: https://doi.org/10.1038/s41598-020-62093-w
Published Online: 2020-03-23
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chu, Cheng-Hao
Mao, Ming-Hua
Lin, You-Ru
Lin, Hao-Hsiung
Text and Data Mining valid from 2020-03-23
Version of Record valid from 2020-03-23
Article History
Received: 14 September 2019
Accepted: 2 March 2020
First Online: 23 March 2020
Competing interests
: The authors declare no competing interests.