In-situ characterization of ultrathin nickel silicides using 3D medium-energy ion scattering
Crossref DOI link: https://doi.org/10.1038/s41598-020-66464-1
Published Online: 2020-06-24
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tran, Tuan Thien
Jablonka, Lukas
Lavoie, Christian
Zhang, Zhen
Primetzhofer, Daniel
Text and Data Mining valid from 2020-06-24
Version of Record valid from 2020-06-24
Article History
Received: 4 November 2019
Accepted: 20 April 2020
First Online: 24 June 2020
Competing interests
: The authors declare no competing interests.