Optical and surface energy probe of Hamaker constant in copper oxide thin films for NEMS and MEMS stiction control applications
Crossref DOI link: https://doi.org/10.1038/s41598-021-83653-8
Published Online: 2021-02-19
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ogwu, Abraham
Darma, T. H.
Text and Data Mining valid from 2021-02-19
Version of Record valid from 2021-02-19
Article History
Received: 11 March 2020
Accepted: 4 February 2021
First Online: 19 February 2021
Competing interests
: The authors declare no competing interests.