Metallic conduction through van der Waals interfaces in ultrathin $$\hbox{Bi}_2\hbox{Te}_3$$ films
Crossref DOI link: https://doi.org/10.1038/s41598-021-85078-9
Published Online: 2021-03-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hatta, Shinichiro
Obayashi, Ko
Okuyama, Hiroshi
Aruga, Tetsuya
Text and Data Mining valid from 2021-03-11
Version of Record valid from 2021-03-11
Article History
Received: 13 August 2020
Accepted: 24 February 2021
First Online: 11 March 2021
Competing interests
: The authors declare no competing interests.