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Identification of type of threading dislocation causing reverse leakage in GaN p–n junctions after continuous forward current stress

Published Online: 2022-01-27

Authors

Narita, Tetsuo

Kanechika, Masakazu

Kojima, Jun

Watanabe, Hiroki

Kondo, Takeshi

Uesugi, Tsutomu

Yamaguchi, Satoshi

Kimoto, Yasuji

Tomita, Kazuyoshi

Nagasato, Yoshitaka

Ikeda, Satoshi

Kosaki, Masayoshi

Oka, Tohru

Suda, Jun
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Text and Data Mining valid from 2022-01-27

Version of Record valid from 2022-01-27
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Article History

Received: 3 September 2021

Accepted: 4 January 2022

First Online: 27 January 2022

Competing interests

: The authors declare no competing interests.

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