Crossmark

Monitoring of semiconductor manufacturing process on Bayesian AEWMA control chart under paired ranked set sampling schemes

Published Online: 2023-12-19

Authors

Wang, Yuzhen

Khan, Imad

Noor-ul-Amin, Muhammad

AlQahtani, Salman A.

Ahmad, Bakhtiyar
License Information

Text and Data Mining valid from 2023-12-19

Version of Record valid from 2023-12-19
More Information

Article History

Received: 23 March 2023

Accepted: 12 December 2023

First Online: 19 December 2023

Competing interests

: The authors declare no competing interests.

Document is current