Properties of phosphorus-boron co-doped c-Si quantum dots/SiNx:H thin film prepared by PECVD in-situ deposition
Crossref DOI link: https://doi.org/10.1038/s41598-024-72560-3
Published Online: 2024-09-16
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gu, Zhifeng
Shan, Feng
Liu, Jia
Text and Data Mining valid from 2024-09-16
Version of Record valid from 2024-09-16
Article History
Received: 2 April 2024
Accepted: 9 September 2024
First Online: 16 September 2024
Competing interests
: The authors declare no competing interests.