Document is current

Any future updates will be listed below

Demonstration of accurate ID-VG characteristics modeling in SiC mosfets using separated artificial neural networks with small training dataset

Crossref DOI link: https://doi.org/10.1038/s41598-025-03005-8

Published Online: 2025-05-29

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark