Quality prediction using multiscale convolutional VAEs for thin plate parts
Crossref DOI link: https://doi.org/10.1038/s41598-026-35186-1
Published Online: 2026-01-21
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Su, Xin
Liu, Yichen
Li, Ji
Text and Data Mining valid from 2026-01-21
Accepted Manuscript valid from 2026-01-21
Article History
Received: 27 August 2025
Accepted: 2 January 2026
First Online: 21 January 2026
Declarations
:
: The authors declare no competing interests.