Analysis of the effect of pressure force on the microstructure properties of pressure measuring films
Crossref DOI link: https://doi.org/10.1038/s41598-026-37837-9
Published Online: 2026-02-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kalina, Adam
Ostachowski, Paweł
Pytel, Maciej
Witkowski, Waldemar
Text and Data Mining valid from 2026-02-03
Version of Record valid from 2026-02-19
Article History
Received: 21 July 2025
Accepted: 27 January 2026
First Online: 3 February 2026
Declarations
:
: The authors declare no competing interests.