Adaptive reinforcement learning for lithography optimization: a scalable AI-driven solution for next-generation semiconductor manufacturing
Crossref DOI link: https://doi.org/10.1038/s41598-026-43555-z
Published Online: 2026-03-15
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rashid, Umar
Shafique, Fahad
Atif, Hamza
Waheed, Waleed
Khan, Rizwan
Akmal, Muhammad
Text and Data Mining valid from 2026-03-15
Accepted Manuscript valid from 2026-03-15
Article History
Received: 18 August 2025
Accepted: 5 March 2026
First Online: 15 March 2026
Declarations
:
: The authors declare no competing interests.