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Measuring the radiation hardness of terahertz devices for space applications

Crossref DOI link: https://doi.org/10.1038/s42005-024-01856-7

Published Online: 2024-11-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

He, Yuan-Zhi https://orcid.org/0000-0001-6317-3038
Ma, Chen-Sheng https://orcid.org/0009-0008-7922-8062
Yin, Hao
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Article History

Received: 19 May 2024

Accepted: 25 October 2024

First Online: 6 November 2024

Competing interests

: The authors declare no competing interests.