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Relationship between hydrogen diffusion and negative-SET occurred in resistive random access memory with inert electrode

Crossref DOI link: https://doi.org/10.1038/s42005-025-02386-6

Published Online: 2025-11-24

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Duan, Yiwei https://orcid.org/0000-0002-0547-2635
Feng, Xudong

Liu, Yuqi

Yang, Haifeng

Liu, Fei https://orcid.org/0000-0003-0959-4178
Qian, Yu https://orcid.org/0000-0002-1926-6218
Yang, Yintang https://orcid.org/0000-0001-9745-5404
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Text and Data Mining valid from 2025-11-24

Version of Record valid from 2025-11-24
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Article History

Received: 14 May 2025

Accepted: 21 October 2025

First Online: 24 November 2025

Competing interests

: The authors declare no competing interests