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Cryogenic electron microscopy and tomography for beam-sensitive materials

Crossref DOI link: https://doi.org/10.1038/s42254-025-00896-4

Published Online: 2025-12-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Cui, Yi https://orcid.org/0000-0001-8219-1856
Zhang, Zewen

Sinclair, Robert

Chiu, Wah

Cui, Yi https://orcid.org/0000-0002-6103-6352
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Text and Data Mining valid from 2025-12-05

Version of Record valid from 2025-12-05
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Article History

Accepted: 22 October 2025

First Online: 5 December 2025

Competing interests

: The authors declare no competing interests.