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Atomic force microscopy from nanoscale imaging to holistic exploration

Crossref DOI link: https://doi.org/10.1038/s42254-026-00956-3

Published Online: 2026-06-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Alsteens, David https://orcid.org/0000-0001-9229-113X
Meyer, Ernst

Müller, Daniel J. https://orcid.org/0000-0003-3075-0665
Gerber, Christoph
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Article History

First Online: 4 June 2026

Competing interests

: The authors declare no competing interests.