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A Single-Device Approach for Simultaneous Measurement of Exciton Diffusion Length and Charge Generation Yield in Organic Semiconductors

Crossref DOI link: https://doi.org/10.1038/s43246-025-01066-w

Published Online: 2026-01-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Nakano, Kyohei https://orcid.org/0000-0003-2493-2817
Kaji, Yumiko https://orcid.org/0000-0002-2130-1262
Tajima, Keisuke https://orcid.org/0000-0003-1590-2640
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Text and Data Mining valid from 2026-01-06

Version of Record valid from 2026-02-06
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Article History

Received: 17 July 2025

Accepted: 22 December 2025

First Online: 6 January 2026

Competing interests

: The authors declare no competing interests.