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X-ray photoelectron spectroscopy of thin films

Crossref DOI link: https://doi.org/10.1038/s43586-023-00225-y

Published Online: 2023-05-25

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Greczynski, Grzegorz https://orcid.org/0000-0002-4898-5115
Haasch, Richard T. https://orcid.org/0000-0001-9479-2595
Hellgren, Niklas

Lewin, Erik https://orcid.org/0000-0001-8617-4834
Hultman, Lars
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Text and Data Mining valid from 2023-05-25

Version of Record valid from 2023-05-25
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Article History

Accepted: 5 April 2023

First Online: 25 May 2023

Competing interests

: The authors declare no competing interests.