Crossmark

Seeing single-layer semiconductor properties in bulk

Crossref DOI link: https://doi.org/10.1038/s44160-023-00388-2

Published Online: 2023-09-14

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Zhang, Kenan https://orcid.org/0000-0003-1343-6068
Luo, Zhengtang https://orcid.org/0000-0002-5134-9240
License Information

Text and Data Mining valid from 2023-09-14

Version of Record valid from 2023-09-14
More Information

Article History

First Online: 14 September 2023

Competing interests

: The authors declare no competing interests.