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Setting a standard for benchmarking 2D transistors with silicon

Crossref DOI link: https://doi.org/10.1038/s44287-024-00093-y

Published Online: 2024-09-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Wu, Peng https://orcid.org/0000-0001-9866-0450
Jiang, Jianfeng

Peng, Lian-Mao https://orcid.org/0000-0003-0754-074X
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Text and Data Mining valid from 2024-09-12

Version of Record valid from 2024-09-12
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Article History

First Online: 12 September 2024

Competing interests

: The authors declare no competing interests.