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Probing the surface of photoactive semiconductors using X-ray photoelectron spectroscopy

Crossref DOI link: https://doi.org/10.1038/s44359-025-00101-w

Published Online: 2025-08-19

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Kowalkińska, Marta https://orcid.org/0000-0003-0518-7508
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Text and Data Mining valid from 2025-08-19

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Article History

First Online: 19 August 2025

Competing interests

: The author declares no competing interests.