Analyzing periodic and random textured silicon thin film solar cells by Rigorous Coupled Wave Analysis
Crossref DOI link: https://doi.org/10.1038/srep06029
Published Online: 2014-08-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dewan, Rahul
Jovanov, Vladislav
Hamraz, Saeed
Knipp, Dietmar
Text and Data Mining valid from 2014-08-12
Version of Record valid from 2014-08-12
Article History
Received: 15 April 2014
Accepted: 23 July 2014
First Online: 12 August 2014
Competing interests
: The authors declare no competing financial interests.