Measuring the Refractive Index of Highly Crystalline Monolayer MoS2 with High Confidence
Crossref DOI link: https://doi.org/10.1038/srep08440
Published Online: 2015-02-13
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhang, Hui
Ma, Yaoguang
Wan, Yi
Rong, Xin
Xie, Ziang
Wang, Wei
Dai, Lun
Text and Data Mining valid from 2015-02-13
Version of Record valid from 2015-02-13
Article History
Received: 21 August 2014
Accepted: 19 January 2015
First Online: 13 February 2015
Competing interests
: The authors declare no competing financial interests.