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Thickness Dispersion of Surface Plasmon of Ag Nano-thin Films: Determination by Ellipsometry Iterated with Transmittance Method

Published Online: 2015-03-23

Authors

Gong, Junbo

Dai, Rucheng

Wang, Zhongping

Zhang, Zengming
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Text and Data Mining valid from 2015-03-23

Version of Record valid from 2015-03-23
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Article History

Received: 18 July 2014

Accepted: 20 February 2015

First Online: 23 March 2015

Competing interests

: The authors declare no competing financial interests.

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