Strain in a silicon-on-insulator nanostructure revealed by 3D x-ray Bragg ptychography
Crossref DOI link: https://doi.org/10.1038/srep09827
Published Online: 2015-05-18
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chamard, V.
Allain, M.
Godard, P.
Talneau, A.
Patriarche, G.
Burghammer, M.
Text and Data Mining valid from 2015-05-18
Version of Record valid from 2015-05-18
Article History
Received: 19 September 2014
Accepted: 19 March 2015
First Online: 18 May 2015
Competing interests
: The authors declare no competing financial interests.