Partial dark-field microscopy for investigating domain structures of double-layer microsphere film
Crossref DOI link: https://doi.org/10.1038/srep10157
Published Online: 2015-05-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Heon Kim, Joon
Su Park, Jung
Text and Data Mining valid from 2015-05-11
Version of Record valid from 2015-05-11
Article History
Received: 13 November 2014
Accepted: 1 April 2015
First Online: 11 May 2015
Competing interests
: The authors declare no competing financial interests.