High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy
Crossref DOI link: https://doi.org/10.1038/srep11876
Published Online: 2015-07-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tranca, D. E.
Stanciu, S. G.
Hristu, R.
Stoichita, C.
Tofail, S. A. M.
Stanciu, G. A.
Text and Data Mining valid from 2015-07-03
Version of Record valid from 2015-07-03
Article History
Received: 10 March 2015
Accepted: 28 May 2015
First Online: 3 July 2015
Competing interests
: The authors declare no competing financial interests.