Electrical level of defects in single-layer two-dimensional TiO2
Crossref DOI link: https://doi.org/10.1038/srep15989
Published Online: 2015-11-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Song, X. F.
Hu, L. F.
Li, D. H.
Chen, L.
Sun, Q. Q.
Zhou, P.
Zhang, D. W.
Text and Data Mining valid from 2015-11-02
Version of Record valid from 2015-11-02
Article History
Received: 11 August 2015
Accepted: 6 October 2015
First Online: 2 November 2015
Competing interests
: The authors declare no competing financial interests.