Speckle lithography for fabricating Gaussian, quasi-random 2D structures and black silicon structures
Crossref DOI link: https://doi.org/10.1038/srep18452
Published Online: 2015-12-18
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bingi, Jayachandra
Murukeshan, Vadakke Matham
Text and Data Mining valid from 2015-12-18
Version of Record valid from 2015-12-18
Article History
Received: 15 June 2015
Accepted: 17 November 2015
First Online: 18 December 2015
Competing interests
: The authors declare no competing financial interests.