Particle alignment reliability in single particle electron cryomicroscopy: a general approach
Crossref DOI link: https://doi.org/10.1038/srep21626
Published Online: 2016-02-22
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vargas, J.
Otón, J.
Marabini, R.
Carazo, J. M.
Sorzano, C. O. S.
Text and Data Mining valid from 2016-02-22
Version of Record valid from 2016-02-22
Article History
Received: 22 January 2015
Accepted: 27 January 2016
First Online: 22 February 2016
Competing interests
: The authors declare no competing financial interests.