Oxidation Effects in Rare Earth Doped Topological Insulator Thin Films
Crossref DOI link: https://doi.org/10.1038/srep22935
Published Online: 2016-03-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Figueroa, A. I.
van der Laan, G.
Harrison, S. E.
Cibin, G.
Hesjedal, T.
Text and Data Mining valid from 2016-03-09
Version of Record valid from 2016-03-09
Article History
Received: 1 December 2015
Accepted: 25 February 2016
First Online: 9 March 2016
Competing interests
: The authors declare no competing financial interests.