Carrier-induced transient defect mechanism for non-radiative recombination in InGaN light-emitting devices
Crossref DOI link: https://doi.org/10.1038/srep24404
Published Online: 2016-04-14
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bang, Junhyeok
Sun, Y. Y.
Song, Jung-Hoon
Zhang, S. B.
Text and Data Mining valid from 2016-04-14
Version of Record valid from 2016-04-14
Article History
Received: 26 February 2016
Accepted: 11 March 2016
First Online: 14 April 2016
Competing interests
: The authors declare no competing financial interests.