Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy
Crossref DOI link: https://doi.org/10.1038/srep24488
Published Online: 2016-04-18
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nho, Hyun Woo
Kalegowda, Yogesh
Shin, Hyun-Joon
Yoon, Tae Hyun
Text and Data Mining valid from 2016-04-18
Version of Record valid from 2016-04-18
Article History
Received: 17 December 2015
Accepted: 30 March 2016
First Online: 18 April 2016
Competing interests
: The authors declare no competing financial interests.