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Thickness Considerations of Two-Dimensional Layered Semiconductors for Transistor Applications

Published Online: 2016-07-12

Authors

Zhang, Youwei

Li, Hui

Wang, Haomin

Xie, Hong

Liu, Ran

Zhang, Shi-Li

Qiu, Zhi-Jun
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Text and Data Mining valid from 2016-07-12

Version of Record valid from 2016-07-12
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Article History

Received: 10 February 2016

Accepted: 22 June 2016

First Online: 12 July 2016

Competing interests

: The authors declare no competing financial interests.

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